发明名称 Wafer separation technique for the fabrication of free-standing (Al,In,Ga)N wafers
摘要 A method of fabricating free-standing (Al, In, Ga)N substrates, by in situ separation of thick epitaxially grown nitride films from their foreign substrates. A suitable substrate for (Al, In, Ga)N film growth is selected, and foreign ions are implanted in the substrate to form a comparatively sharp concentration profile. An (Al, In Ga)N film is deposited on the substrate, and the deposited film is cooled to introduce thermal expansion mismatch-related strain, so that the film spontaneously separates from the substrate.
申请公布号 US2006234486(A1) 申请公布日期 2006.10.19
申请号 US20060403624 申请日期 2006.04.13
申请人 SPECK JAMES S;BAKER TROY J;HASKELL BENJAMIN A 发明人 SPECK JAMES S.;BAKER TROY J.;HASKELL BENJAMIN A.
分类号 H01L21/3205;H01L21/28;H01L21/44;H01L21/4763 主分类号 H01L21/3205
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