| 摘要 |
A testing system for testing a manufactured semiconductor component includes a main processor and a pattern generator. The main processor is configured to run a main program. The pattern generator is configured to generate a plurality of functional test patterns, and each test pattern is assembled to test the manufactured semiconductor component thereby producing a test result for each test pattern. The main processor and main program communicate with the pattern generator and functional test patterns such that the plurality of functional test patterns is sequentially run on the manufactured semiconductor component. Furthermore, the main program receives the test result of each functional test pattern after it is run. The manufactured semiconductor component continues to operate between each of the functional test patterns.
|
