发明名称 MAGNETIC IMPEDANCE MEASURING DEVICE
摘要 <p>An AC magnetic field of low frequency is applied to a measurement object and distribution of induced current is measured to detect distribution of the impedance characteristic of the measurement object. A magnetic impedance measuring device includes: an application coil for generating an AC magnetic field whose frequency can be varied and a power source for the application coil; at least a pair of magnetic sensor means formed by two magnetic sensors for detecting a vector component parallel to the application coil surface by a vector component orthogonal to the magnetic field generated by the measurement object; magnetic sensor measuring means arranged apart from the application coil surface to oppose to the measurement object for measuring a detection signal of the magnetic sensor means; a lock-in amplifier circuit for detecting a signal of the same frequency as the application coil from the output of the magnetic sensor measuring means; and analysis means for analyzing the output intensity and the phase change of the magnetic sensor by the output signal of the lock-in amplifier circuit.</p>
申请公布号 WO2006109382(A1) 申请公布日期 2006.10.19
申请号 WO2006JP304927 申请日期 2006.03.13
申请人 NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY;TSUKADA, KEIJI;KIWA, TOSHIHIKO 发明人 TSUKADA, KEIJI;KIWA, TOSHIHIKO
分类号 G01R31/302;G01N27/72;G01N27/82;G01R33/02 主分类号 G01R31/302
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