TEST TRAY INSERT

摘要

A test tray insert includes a first and a second device accommodating portion (122,124) for accommodating and maintaining a semiconductior device therein, a middle protion (120b) between the first and the second device accommodating portion, and a first and a second end portion (120a, 120c) outside the first device accommodating portion. The first end portion, the fist device accommodating portion, the middle portion, the second device accommodating portion and the second end portion are provided in sequence in a lenghtwise direction of the insert, and a first guide hole (132) is provided at the middle portion to correspond to the first guide pin of the test head. Therefore, it is possible to allow an effective electrical contact between semiconductor device and sockets on a test head in spite of a thermal or a contraction at a high or a low temperature.