发明名称 MEASUREMENT METHOD FOR DIELECTRIC CHARACTERISTICS AND MEASUREMENT METHOD FOR CONDUCTIVITY
摘要 PROBLEM TO BE SOLVED: To provide a measurement method for dielectric characteristics and a measurement method for conductivity, capable of easily handling in a millimeter-wave band and suppressing unwanted modes. SOLUTION: An input side NRD guide 3 and an output side NRD guide 4 are configured, and an input side slot 11 and an output side slot 12 are formed. A barrier wall 5 of a conductor is provided at a position of equal distance from the input side slot 11 and output side slot 12, in respective extension directions of dielectrics strips 31, 41 between distal ends of a pair of dielectrics strips 31, 41. A conductor plate 61 is arranged so as to cover the input side slot 11, and an output side slot 12 and a dielectrics sample 62 is arranged, and then a resonator 6 is configured between the input side slot 11 and output side slot 12, and the dielectric characteristics of the dielectrics sample 62 is determined by exciting the TE mode of the resonator 6 to measure the resonance frequency and the no-load Q of the resonator 6. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006284540(A) 申请公布日期 2006.10.19
申请号 JP20050108717 申请日期 2005.04.05
申请人 KYOCERA CORP 发明人 YOSHIKAWA HIROMICHI;NAKAYAMA AKIRA
分类号 G01R27/26;G01N22/00 主分类号 G01R27/26
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