发明名称 PARALLELISM MEASURING DEVICE AND MANUFACTURING METHOD OF ELECTRO-OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a parallelism measuring device capable of measuring and adjusting parallelism of a crimp member even at a high temperature easily at low cost in the pressed state onto a conductive member, and a manufacturing method of an electro-optical device for manufacturing the electro-optical device by using the parallelism measuring device. SOLUTION: The parallelism measuring device 1 is provided with sensors 3 or the like as a plurality of conductive members whose resistance values are changed by being pressed onto the substrate surface 12, and is equipped with a measuring part 11 for measuring the resistant value or a voltage value of the sensors 3 or the like. Hereby, the difference of pressure intensity by an upper crimp head 16 or the like on the position of each sensor, namely, the parallelism of the upper crimp head 16 or the like to the plurality of sensor surfaces, can be measured, for example, by comparing a change of each voltage value of the plurality of sensors 3 or the like relative to each sensor. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006284325(A) 申请公布日期 2006.10.19
申请号 JP20050103543 申请日期 2005.03.31
申请人 SANYO EPSON IMAGING DEVICES CORP 发明人 SAIJO TAKESHI
分类号 G01B7/06 主分类号 G01B7/06
代理机构 代理人
主权项
地址