| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a light-emitting device and a manufacturing method of the device which is so constituted that its light-emitting elements brought into faulty states caused by their short-circuitings are selected accurately and are subjected to no current application, in order to improve its yield in the light-emitting device assembled out of a plurality of light-emitting elements. <P>SOLUTION: The manufacturing method of the light-emitting device has a process for so applying currents to its light-emitting elements as to measure their forward resistances or luminous intensities, and has a process for giving to the device a means for applying no current to its light-emitting elements, the values of whose forward resistances or luminous intensities are lower than specified values. <P>COPYRIGHT: (C)2007,JPO&INPIT |
