发明名称 PAGE BUFFER CIRCUIT OF FLASH MEMORY DEVICE HAVING IMPROVED OPERATION PERFORMANCE, ITS READ-OUT METHOD, AND PROGRAM OPERATION CONTROL METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce the overall chip size by including a page buffer and reducing a coupling capacitance component between sensing nodes. <P>SOLUTION: The page buffer circuit of a flash memory device includes a plurality of page buffers connected to a predetermined number of bit lines, respectively, and also connected to a Y-gate circuit, and the page buffers performs a read operation or program operation at the same time in response to bit line control signals, bit line select signals, and control signals. Each of the plurality of page buffers stores sensing data corresponding to read-out data received from any one line of the bit lines set in the read operation, outputs the stored sensing data to the Y-gate circuit, stores program data received from the Y-gate circuit at the time of program operation, and outputs the stored program data to any one line of the predetermined number of bit lines. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006286167(A) 申请公布日期 2006.10.19
申请号 JP20050366796 申请日期 2005.12.20
申请人 HYNIX SEMICONDUCTOR INC 发明人 KIN TOKUCHU
分类号 G11C16/06 主分类号 G11C16/06
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