发明名称 Apparatus for conditioning chemical-mechanical polishing pads
摘要 An apparatus for conditioning a polishing pad, or conditioner, includes a supporting substrate and abrasive elements. The abrasive elements of the conditioner are used to condition a polishing pad to be used in abrasive, or at least partially mechanical, semiconductor substrate treatment processes, such as chemical-mechanical polishing or chemical-mechanical planarization processes. The abrasive elements are formed from a material that may be degraded or dissolved by at least one chemical that will not substantially degrade or dissolve a material of the polishing pad. Any residue or particles of, or from, the abrasive elements that stick to or become embedded in the polishing pad are removed therefrom by exposing the polishing pad to the at least one chemical so as to degrade or dissolve the residue or particles without substantially degrading or dissolving a material of the polishing pad.
申请公布号 US2006234610(A1) 申请公布日期 2006.10.19
申请号 US20060454501 申请日期 2006.06.16
申请人 发明人 KRAMER STEPHEN J.
分类号 B24B21/18 主分类号 B24B21/18
代理机构 代理人
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