发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus is disclosed. The apparatus includes an illuminator for conditioning a beam of radiation, and a first support for supporting a patterning device that serves to pattern the beam of radiation according to a desired pattern. The apparatus also includes a second support for supporting a substrate, a projection system for projecting the patterned beam onto a target portion of the substrate, and at least one gas generator for generating a conditioned gas flow. The gas generator includes a guiding element for guiding the gas flow to a lower volume generally located below a lower surface of the projection system and to a volume between the lower surface and the substrate. The guiding element directs the gas flow in a generally downward direction and then in a direction generally parallel to the lower surface.
申请公布号 US2006232754(A1) 申请公布日期 2006.10.19
申请号 US20060437745 申请日期 2006.05.22
申请人 ASML NETHERLANDS B.V. 发明人 LALLEMANT NICOLAS A.;VERHAGEN MARTINUS C.M.;BECKERS MARCEL;STULTIENS RONALD;SMITS PASCAL A.;HERTOG WLADIMIR FRANSISCUS G.M.;VAN DER PLAS DAVID T.W.;KOELINK STEPHAN;KRUS HENK
分类号 G03B27/52;G03F7/20;H01L21/027 主分类号 G03B27/52
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