Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
申请公布号
WO2006110414(A2)
申请公布日期
2006.10.19
申请号
WO2006US12622
申请日期
2006.04.04
申请人
AVERY DENNISON CORPORATION;FORSTER, IAN, JAMES;WEAKLEY, THOMAS, C.