| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a microscope device for operation capable of performing clear observation regardless of the state of a part to be observed. <P>SOLUTION: The microscope device for operation comprises: an illumination optical system 20 for forming the rectangular emission image of a pupil, by adopting a direction connecting right and left observation optical axes OR and OL as a longitudinal direction, at the opposite side position of an operator across an observation optical system 30, having an illumination light source 21 and a slit plate 24 with a slit hole 24a whose longitudinal direction is the same as that of the emission pupil; an objective lens 15 where the observation light path of the observation optical system 30 and the illumination optical path of the illumination optical system 20 pass through; and another illumination optical system 40 for forming another rectangular emission image of the pupil at a position different from that of the emission image of the pupil in the illumination optical system 20, having an illumination light source 41 for outputting another illumination light and a slit plate 44 with a slit hole 44a whose longitudinal direction is the same as that of another emission image of the pupil, so as to irradiate an operation eye E with another illumination light passing through the slit hole 44a by way of the objective lens 15. <P>COPYRIGHT: (C)2007,JPO&INPIT |
