发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the ambient temperature dependency of drain current in a semiconductor device wherein MOS transistor is used as a constant-current circuit. SOLUTION: The semiconductor device comprises an element region 12 formed in a substrate 11, an element isolation region 17 so formed as to surround the element region in the substrate 11, and the MOS transistor formed in the element region 12. The area of the element region 12 is so set that a change of current in the MOS transistor with respect to the ambient temperature may be small. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006286722(A) 申请公布日期 2006.10.19
申请号 JP20050101447 申请日期 2005.03.31
申请人 TOSHIBA CORP 发明人 YABE TOMOAKI
分类号 H01L21/822;H01L21/8234;H01L27/04;H01L27/088;H01L29/78 主分类号 H01L21/822
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