发明名称 Method and apparatus for performing metrology dispatching based upon fault detection
摘要 A method and an apparatus for dynamically adjusting a metrology routing of a batch of workpieces. The method comprises performing a process step upon a batch of workpieces using a processing tool, performing a tool state analysis upon the processing tool, and performing a dynamic metrology routing adjustment process based upon the tool state analysis. The dynamic metrology routing adjustment process further comprises correlating the tool state analysis to the batch of workpieces and adjusting a metrology routing based upon the correlation.
申请公布号 GB2419688(B) 申请公布日期 2006.10.18
申请号 GB20060001691 申请日期 2004.06.02
申请人 ADVANCED MICRO DEVICES, INC 发明人 NAOMI M JENKINS;TIMOTHY L JACKSON;HOWARD E CASTLE;BRIAN K CUSSON
分类号 H01L21/66;G05B19/418 主分类号 H01L21/66
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