发明名称 Testing input/output voltages in integrated circuits
摘要 An integrated circuit (IC) measures a voltage at an interface of the IC. The IC comprises voltage reference, comparator, and control circuits. The voltage reference circuit provides reference voltages responsive to a control input. The comparator circuit compares a first reference voltage with a voltage at the interface. The control circuit receives an output of the comparator and adjusts the control input to provide a second reference voltage closer to the voltage at the interface. A method for measuring voltage at an IC interface comprises generating a first reference voltage, monitoring the voltage at the interface from within the IC, comparing the first reference and interface voltages, generating a second reference voltage responsive to a result of the comparing, replacing the first reference voltage with the second reference voltage, and repeating until an applied reference voltage is substantially equal to the voltage at the interface.
申请公布号 US7123039(B2) 申请公布日期 2006.10.17
申请号 US20040917766 申请日期 2004.08.13
申请人 GONZALEZ JASON 发明人 GONZALEZ JASON
分类号 G01R31/26;G01R31/02;G01R31/30;G01R31/3187 主分类号 G01R31/26
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