发明名称 THERMAL SHOCK TESTER OF ELECTRONIC PART
摘要 A thermal shock tester for electronic components is provided to improve reliability and quality of a product by installing a heating unit at the upper side of a test piece and applying heat shock load similar to the actual environment. A thermal shock tester(100) for electronic components includes a cooling element(130) with a test piece(1) mounted at the upper surface, to cool the test piece; a heating unit(120) installed at the upper side of the test piece to emit the heat to the test piece; and a control unit(190) controlling the cooling element and the heating unit. A lamp screen(122) is arranged between the heating unit and the test piece. The upper end of the lamp screen is placed at the perimeter of the heating unit, and the lower end of the lamp screen includes the whole test piece. The cooling element is a Peltier element. A radiating unit(132) is formed at the lower surface of the cooling element.
申请公布号 KR100637724(B1) 申请公布日期 2006.10.17
申请号 KR20050045544 申请日期 2005.05.30
申请人 KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY EVALUATION AND PLANNING(KOREA TESTING LABORATORY) 发明人 JEON, MIN SEOK;SHIN, MIN CHURL;SHIN, HYUN GYU;KIM, YONG NAM;SONG, JUN GWANG;LEE , HEE SOO
分类号 G01M99/00;G01N3/60 主分类号 G01M99/00
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