发明名称 |
Non-volatile semiconductor memory device |
摘要 |
A plurality of memory cells are connected between two adjacent sub-bit lines. A row decoder 3 selects a word line connected to a memory cell to be read. A selection line selection circuit 2 and a column selection circuit 5 include first and second selection portions that perform selection operations simultaneously and independently. The first selection portion selects a first pair of main bit lines and selection lines in order to select the memory cell to be read. The second selection portion selects a second pair of main bit lines that is different from the first pair of main bit lines and selection lines for selecting a sector different from that for the memory cell to be read in order to select a line to be used for reading a reference voltage.
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申请公布号 |
US7123510(B2) |
申请公布日期 |
2006.10.17 |
申请号 |
US20050058374 |
申请日期 |
2005.02.16 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
KOJIMA MAKOTO;MARUYAMA TAKAFUMI |
分类号 |
G11C16/04;G11C16/06;G11C16/02 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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