发明名称 Mask pattern forming method and patterning method using the mask pattern
摘要 A method of forming a mask pattern includes a step of laminating a first resist layer on a base layer, a step of exposing the first resist layer using a first pattern with a pattern of at least one via hole, a step of developing the first resist layer exposed to remove a part of the first resist layer, the part corresponding to an area of the at least one via hole, a step of laminating a second resist layer on the first resist layer and on the base layer in the area of the at least one via hole, a step of exposing the second resist layer using a second pattern, and a step of developing the second resist layer exposed and the first resist layer to remove a part of the second resist layer and all of the first resist layer so as to form the mask pattern made of the second resist layer.
申请公布号 US7122282(B2) 申请公布日期 2006.10.17
申请号 US20030391799 申请日期 2003.03.20
申请人 TDK CORPORATION 发明人 SATO YOSHIKAZU;KAMIJIMA AKIFUMI
分类号 G03F7/40;G03F9/00;G03C5/00;G03F7/00;G03F7/20;G11B5/31;H01L21/027 主分类号 G03F7/40
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