发明名称 Capacitor layout technique for reduction of fixed pattern noise in a CMOS sensor
摘要 A new capacitor architecture includes a front plate of the capacitor formed form a first polysilicon layer. The front plate is surround by a first dielectric layer and a second dielectric layer. The back plate of the capacitor is formed from one layer of a first two-layer conductive structure which surrounds the first dielectric layer and the second dielectric layer. The two-layer conductive structure is an equal potential structure and includes a conductive coupling between the two layers.
申请公布号 US7124384(B2) 申请公布日期 2006.10.17
申请号 US20040881002 申请日期 2004.07.01
申请人 MICRON TECHNOLOGY, INC. 发明人 ROSSI GIUSEPPE
分类号 H01L29/00;G06F17/50;H01L27/08;H01L29/94 主分类号 H01L29/00
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