发明名称 |
Positive resist composition and pattern formation method using the same |
摘要 |
A positive resist composition comprising: (A) a resin having alicyclic hydrocarbon groups in side chains, containing specified two types of repeating units, which increases the solubility in an alkali developing solution by the action of an acid; and (B) a particular sulfonium compound having a specified structure and capable of generating an acid upon irradiation with an actinic ray or radiation.
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申请公布号 |
US7122589(B2) |
申请公布日期 |
2006.10.17 |
申请号 |
US20030669603 |
申请日期 |
2003.09.25 |
申请人 |
FUJI PHOTO FILM CO., LTD |
发明人 |
NISHIYAMA FUMIYUKI;SATO KENICHIRO;KODAMA KUNIHIKO |
分类号 |
C08K5/36;C08K5/45;G03F7/004;G03F7/039;H01L21/312 |
主分类号 |
C08K5/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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