发明名称 |
METHOD FOR FABRICATING TRANSISTOR IN SEMICONDUCTOR DEVICE |
摘要 |
A method for forming a transistor of a semiconductor device is provided to decrease the number of process steps by selectively forming a spacer layer of a gate pattern by a micro contact printing method. A gate pattern(280) is formed on a semiconductor substrate(230) having a cell region and a peripheral circuit region. A buffer oxide layer(290) and a silicon nitride layer(300) are formed on the gate pattern and the semiconductor substrate. An oxide control material is coated on the silicon nitride layer in a region except an oxide layer formation region for a gate spacer. An oxide layer for the gate spacer is formed on the gate pattern. The oxide control material is removed by using etchant including sulfuric acid and hydrogen peroxide.
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申请公布号 |
KR100636683(B1) |
申请公布日期 |
2006.10.13 |
申请号 |
KR20050058772 |
申请日期 |
2005.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JAE SOO;LEE, AN BAE;EUN, YONG SEOK;SEO, HYE JIN |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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主权项 |
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地址 |
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