发明名称 METHOD FOR FABRICATING TRANSISTOR IN SEMICONDUCTOR DEVICE
摘要 A method for forming a transistor of a semiconductor device is provided to decrease the number of process steps by selectively forming a spacer layer of a gate pattern by a micro contact printing method. A gate pattern(280) is formed on a semiconductor substrate(230) having a cell region and a peripheral circuit region. A buffer oxide layer(290) and a silicon nitride layer(300) are formed on the gate pattern and the semiconductor substrate. An oxide control material is coated on the silicon nitride layer in a region except an oxide layer formation region for a gate spacer. An oxide layer for the gate spacer is formed on the gate pattern. The oxide control material is removed by using etchant including sulfuric acid and hydrogen peroxide.
申请公布号 KR100636683(B1) 申请公布日期 2006.10.13
申请号 KR20050058772 申请日期 2005.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JAE SOO;LEE, AN BAE;EUN, YONG SEOK;SEO, HYE JIN
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址