| 摘要 |
PROBLEM TO BE SOLVED: To facilitate the speedy grasp of a test result and a device-specific trend. SOLUTION: An analysis system of mesurements of a semiconductor element comprises a display means 30 for displaying the measurements stored in a storing means 20 as a graph in an individual window, an input means 10 for selecting several windows, a mesurement rendering means 210 for storing the information of types of the graphs displayed on several individual windows selected and dislaying the graph of the measuements; and a computing means 40 for laying a position of a graph axis in the case of the same graph type, making transparent only the inside of the display area of one graph and making transparent at least the inside of the display area of the other graph, displaying the one graph as a top window on the display device 30, and making opaque at least the inside of the display area of the graph in the bottom window to lay the other graphs under the one graphs. COPYRIGHT: (C)2007,JPO&INPIT
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