发明名称 METHOD FOR FORMING A BARRIER/SEED LAYER FOR COPPER METALLIZATION
摘要 A method (400) for improving adhesion of Cu to a Ru layer (650a, 650b) in Cu metallization. The method (400) includes providing a substrate (25, 125) in a process chamber (10, 110) of a deposition system (1 , 100), depositing a Ru layer (650a, 650b) on the substrate (25, 125) in a chemical vapor deposition process, and forming a Cu seed layer (660a, 660b) on the Ru layer (650a, 650b) to prevent oxidation of the Ru layer (650a, 650b). The Cu seed layer (660a, 660b) is partially or completely oxidized prior to performing a Cu bulk plating process on the substrate (25, 125). The oxidized portion (660a, 667) of the Cu seed layer (660a, 660b) is substantially dissolved and removed from the substrate (25, 125) during interaction with a Cu plating solution, thereby forming a bulk Cu layer (670a, 670b) with good adhesion to the underlying Ru layer (650a, 650b).
申请公布号 WO2006107545(A2) 申请公布日期 2006.10.12
申请号 WO2006US09219 申请日期 2006.03.14
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON AMERICA, INC.;SUZUKI, KENJI 发明人 SUZUKI, KENJI
分类号 C23C16/16;C23C16/06;C23C16/18;H01L21/288 主分类号 C23C16/16
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