发明名称 HEAT TREATMENT APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a heat treatment apparatus capable of obtaining large throughput and increasing uniformity of the temperature of a treated substrate, and a method of manufacturing a semiconductor device. SOLUTION: An ALD apparatus for alternately supplying a plurality of treatment gas on the front surface of wafer 1 and forming a film on the wafer 1 using an ALD method, has a boat 2 for holding the plurality of wafer 1, a treatment chamber 12 for housing the wafer 1 and the boat 2, a heater 14 for heating the wafer 1, a gas supply pipe 21 for alternately supplying the plurality of treatment gas in the treatment chamber 12, a discharge pipe 16 for discharging atmosphere in the treatment chamber 12, and a rotation axis 19 for rotating the boat 2 for rotating the wafer during the treatment of the wafer 1. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006279058(A) 申请公布日期 2006.10.12
申请号 JP20060135355 申请日期 2006.05.15
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TOYODA KAZUYUKI;INOKUCHI YASUHIRO;TAKEBAYASHI MOTONARI;KONYA TADASHI;ISHIMARU NOBUO
分类号 H01L21/316;C23C16/455;H01L21/3065;H01L21/31 主分类号 H01L21/316
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