发明名称 Sampling phase detector for delay-locked loop
摘要 A delay-locked loop (DLL) architecture is provided that includes a voltage controlled delay line, a sample-and-hold circuit and an amplifier circuit. The voltage controlled delay line may have a plurality of buffer stages to provide a first clock signal and a second clock signal. The sample-and-hold circuit may receive signals corresponding to the first clock signal and the second clock signal. The sample-and-hold circuit may provide two sampled signals based on the received signals. Additionally, the amplifier circuit may be coupled to the sample-and-hold circuit and the voltage controlled delay line. The amplifier circuit may provide a control voltage to the buffer stages of the voltage controlled delay line based on the sampled signals received from the sample-and-hold circuit.
申请公布号 US2006226881(A1) 申请公布日期 2006.10.12
申请号 US20050103527 申请日期 2005.04.12
申请人 INTEL CORPORATION 发明人 JAUSSI JAMES E.;MOONEY RANDY R.
分类号 H03L7/06 主分类号 H03L7/06
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