发明名称 Optical axis adjusting mechanism for X-ray lens, X-ray analytical instrument, and method of adjusting optical axis of X-ray lens
摘要 An optical axis adjusting mechanism for an X-ray lens, an X-ray analytical instrument and a method of adjusting an optical axis of an X-ray lens, capable of enhancing detection efficiency of an X-ray while preventing degradation of the device performance are provided. An optical axis adjusting mechanism for an X-ray lens to be implemented in an X-ray analytical instrument, includes an exit side adjusting mechanism for adjusting an exit side focal point of the X-ray lens to focus on an X-ray detector, and an entrance side adjusting mechanism for adjusting an entrance side focal point of the X-ray lens to focus on an analytical point of a sample, and the entrance side adjusting mechanism is disposed with a greater distance from the X-ray lens than a distance between the exit side adjusting mechanism and the X-ray lens.
申请公布号 US2006226340(A1) 申请公布日期 2006.10.12
申请号 US20060389447 申请日期 2006.03.24
申请人 SASAYAMA NORIO;OKAWARA AKIKAZU;NAKAYAMA SATOSHI 发明人 SASAYAMA NORIO;OKAWARA AKIKAZU;NAKAYAMA SATOSHI
分类号 H01L27/00 主分类号 H01L27/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利