发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which poor connection between a wiring board and a semiconductor chip can be reduced during heat treatment, and poor connection between the wiring board and the mounting substrate can be reduced during packaging accompanying heat treatment. <P>SOLUTION: The semiconductor device comprises a semiconductor substrate having a first surface, a second surface which is the rear surface of the first surface, and a first through electrode penetrating the first and second surfaces, a semiconductor chip composed of the same kind of a material as that of the semiconductor substrate and mounted on the first surface of the semiconductor substrate while being connected electrically with the first through electrode, a flexible stress relax portion formed on the second surface of the semiconductor substrate while being connected electrically with the first through electrode, and an external connection terminal connected with a first conductor on the stress relax portion. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006278906(A) 申请公布日期 2006.10.12
申请号 JP20050098591 申请日期 2005.03.30
申请人 OKI ELECTRIC IND CO LTD 发明人 EGAWA YOSHIMI
分类号 H01L23/12 主分类号 H01L23/12
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