发明名称 EQUIPMENT DIAGNOSTIC DEVICE AND EQUIPMENT DIAGNOSTIC PROGRAM
摘要 <p><P>PROBLEM TO BE SOLVED: To contribute to prevention of an inspection omission by classifying the state of equipment, and outputting candidates of abnormality codes corresponding to classification. <P>SOLUTION: The state of the equipment 101 is classified based on state value history collected from the equipment 101 through an information collecting device 102 and a communication means 103, and statistics of abnormality codes are taken for every classification to output the candidates of an abnormal state corresponding to the inputted state. In outputting the candidates of the abnormal state, the candidates of the abnormal state are displayed together with the score which shows the degree of possibility of abnormality in descending order of the possibility of abnormality in a learning process. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006276924(A) 申请公布日期 2006.10.12
申请号 JP20050090443 申请日期 2005.03.28
申请人 HITACHI LTD 发明人 SUZUKI HIDEAKI;YOKOTA TOSHIMI;SAITO MASAHIKO;TAIRA TOMOTSUNE;MATSUMURA AKIRA
分类号 G05B23/02 主分类号 G05B23/02
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