| 摘要 |
PROBLEM TO BE SOLVED: To acquire properly the resistance characteristic of a resistance film in a high frequency band. SOLUTION: A radio wave W in a high frequency band is transmitted to/received from a measuring object 1 wherein the resistance film 2 is interposed between dielectrics 3a, 3b having respectively a known dielectric constant and thickness and a conductor layer 4 is provided on the back of the dielectric 3b on one side, by a transmitting antenna 5 and a receiving antenna 6 connected to a vector network analyzer 7, to thereby measure a radio wave reflection characteristic, and a resistance value of the resistance film 2 is calculated, based on comparison between the measured reflection characteristic data and calculated reflection characteristic data calculated by setting the resistance value of the resistance film 2 by using a transmission line model of the measuring object 1. COPYRIGHT: (C)2007,JPO&INPIT
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