发明名称 Semiconductor epitaxial wafer
摘要 Multiple epitaxial layers are grown on the front side of a p silicon substrate and no layers are grown on the other side. Among the multiple epitaxial layers the one in contact with the silicon substrate is a first p<SUP>+</SUP> epitaxial layer. Since the epitaxial layer is in contact with the p<SUP>+</SUP> layer, gettering can be efficiently done also in a low-temperature device manufacturing process, thereby improving the manufacturing yield of an epitaxial wafer. Therefore the manufacturing cost of an epitaxial wafer is reduced.
申请公布号 US2006226514(A1) 申请公布日期 2006.10.12
申请号 US20050550325 申请日期 2005.09.23
申请人 JIKEN HIROSHI;JIKEN HIROSHI;NASU YUUICHI;MASUDA TAKESHI 发明人 JIKEN HIROSHI;JIKEN HIROSHI;NASU YUUICHI;MASUDA TAKESHI
分类号 H01L23/58;H01L21/322 主分类号 H01L23/58
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