发明名称 |
Semiconductor epitaxial wafer |
摘要 |
Multiple epitaxial layers are grown on the front side of a p silicon substrate and no layers are grown on the other side. Among the multiple epitaxial layers the one in contact with the silicon substrate is a first p<SUP>+</SUP> epitaxial layer. Since the epitaxial layer is in contact with the p<SUP>+</SUP> layer, gettering can be efficiently done also in a low-temperature device manufacturing process, thereby improving the manufacturing yield of an epitaxial wafer. Therefore the manufacturing cost of an epitaxial wafer is reduced.
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申请公布号 |
US2006226514(A1) |
申请公布日期 |
2006.10.12 |
申请号 |
US20050550325 |
申请日期 |
2005.09.23 |
申请人 |
JIKEN HIROSHI;JIKEN HIROSHI;NASU YUUICHI;MASUDA TAKESHI |
发明人 |
JIKEN HIROSHI;JIKEN HIROSHI;NASU YUUICHI;MASUDA TAKESHI |
分类号 |
H01L23/58;H01L21/322 |
主分类号 |
H01L23/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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