发明名称 DRILLER FOR SEMICONDUCTOR WAFER AND METHOD OF MEASURING THICKNESS OF SURFACE LAYER OF SEMICONDUCTOR WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a driller for a semiconductor wafer capable of stably and surely boring a fine circular hole, and repeatedly using a durable ball for drilling a hole. <P>SOLUTION: This driller for a semiconductor wafer at least includes: a stage 4 for holding a semiconductor wafer W; the ball 1 for drilling a hole in the semiconductor wafer W held on the stage 4; and a rotating mechanism 15 for holding the ball 1 and rotating it. The rotating mechanism 15 at least includes: a driving shaft 2 for rotating the ball 1; and a rotatable driven receiver 3 for supporting the ball 1 from the opposite side of the driving shaft 2, wherein the ball 1 made of silicon carbide is held by the driven receiver 3 and the driving shaft 2, the driving shaft 2 is rotated to rotate the ball 1 and supply a polishing agent, and the ball 1 is brought into contact with the semiconductor wafer W held on the stage 4, thereby drilling a hole in the semiconductor wafer W. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006272534(A) 申请公布日期 2006.10.12
申请号 JP20050099132 申请日期 2005.03.30
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 ITAMI TAKASHI
分类号 B24B37/025;B24B47/12;H01L21/02;H01L21/22;H01L21/66 主分类号 B24B37/025
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