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发明名称
AUTOMATIC INSPECTION APPARATUS OF SUBSTRATE FOR SEMICONDUCTOR PACKAGE
摘要
申请公布号
KR100632259(B1)
申请公布日期
2006.10.12
申请号
KR20050007917
申请日期
2005.01.28
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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