发明名称 Protection circuit provided in semiconductor circuit
摘要 A semiconductor device comprises a power supply terminal (TV), a reference terminal (TG), a first p-channel MOS transistor (P1), a second p-channel MOS transistor (P2), a first n-channel MOS transistor (N1), and a second n-channel MOS transistor (N2). The power supply terminal (TV) is supplied with a power supply potential. The reference terminal (TG) is supplied with a reference potential. The first p-channel MOS transistor (P1) has a gate (17), a source (14), a drain (16), and a back gate (12). The gate, source and back gate are connected to the power supply terminal (TV). The second p-channel MOS transistor (P2) has a gate (18), a source (16), a drain (15), and a back gate (12). The source (16) is connected to the drain (16) of the first p-channel MOS transistor (P1). The back gate is connected to the power supply terminal (TV). The gate and drain are connected to the reference terminal (TG). The first n-channel MOS transistor (N1) has a gate (24), a source (21), a drain (23), and a back gate (11). The gate, source and back gate are connected to the reference terminal (TG). The second n-channel MOS transistor (N2) has a gate (25), a source (23), a drain (22), and a back gate (11). The source (23) is connected to the drain (23) of the first n-channel MOS transistor (N1). The back gate is connected to the reference terminal (TG). The gate and drain are connected to the power supply terminal (TV).
申请公布号 EP1202351(A3) 申请公布日期 2006.10.11
申请号 EP20010124383 申请日期 2001.10.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAKIBA, AKIRA;KINUGASA, MASANORI;ITOH, YOSHIMITSU;MIZUTA, MASARU
分类号 H01L27/02;H01L27/04;H01L21/822;H01L21/8238;H01L27/092 主分类号 H01L27/02
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