发明名称 Double trench for isolation of semiconductor devices
摘要 A semiconductor device has a substrate (50), a buried layer (55), an active area extending from a surface contact to the buried layer, an insulator (130) in a first trench extending towards the buried layer, to isolate the active area, and a second insulator (130) in a second deep trench and extending through the buried layer to isolate the buried layer and the active area from other parts of the substrate. This double trench can help reduce the area needed for the electrical isolation between the active device and the other devices. Such reduction in area can enable greater integration or more cells in a multi cell super-MOS device, and so improve performance parameters such as Ron. The double trench can be manufactured using a first mask to etch both trenches at the same time, and subsequently using a second mask to etch the second deep trench deeper.
申请公布号 EP1710834(A2) 申请公布日期 2006.10.11
申请号 EP20060007330 申请日期 2006.04.06
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 MOENS, PETER;TACK, MARNIX;BOONEN, SYLVIE;COLSON, PAUL
分类号 H01L21/762;H01L21/308;H01L21/763 主分类号 H01L21/762
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