发明名称 Thin film device
摘要 The present invention provides a thin film device in which parasitic capacitance can be reduced as much as possible. In the case where a coil is provided so as to be insulated between an upper magnetic film and a lower magnetic film, the coil is constructed so that the cross section of the coil has the minimum width at its edges closest to the upper and lower magnetic films. Parasitic capacitance generated between the coil and the lower magnetic film and parasitic capacitance generated between the coil and the upper magnetic film are reduced and, in addition, parasitic capacitance generated between turns of the coil is also reduced.
申请公布号 EP1708210(A2) 申请公布日期 2006.10.04
申请号 EP20060006612 申请日期 2006.03.29
申请人 TDK CORPORATION 发明人 FUJIWARA, TOSHIYASU
分类号 H01F17/00 主分类号 H01F17/00
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