发明名称 Probing apparatus and positional deviation acquiring method
摘要 <p>In a prober, a post-contact image representing a region including a pad is acquired by capturing an image of a substrate after a probe has been brought into contact with the pad having an existing probe mark. An image storage unit stores in advance a pre-contact image representing the pad-inclusive region before the probe is brought into contact with the pad. A latest probe mark position acquiring unit acquires a position of a latest probe mark region created by the contact of the probe with the pad from among a plurality of probe mark regions in the post-contact image respectively corresponding to a plurality of probe marks on the pad by comparing the post-contact image with the pre-contact image. A positional deviation acquiring unit finds a deviation in a contact position of the probe with respect to the pad, based on the position of the latest probe mark region.</p>
申请公布号 EP1707971(A1) 申请公布日期 2006.10.04
申请号 EP20060006237 申请日期 2006.03.27
申请人 TOKYO ELECTRON LIMITED 发明人 KURIHARA, DAIKI;CHAYA, HIROMI;HYAKUDOMI, TAKANORI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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