发明名称 Semiconductor raised source-drain structure
摘要 A transistor structure which includes a raised source, a raised drain, a gate located between the source and the drain, a first capping layer in communication with at least a portion of the gate and the source, a second capping layer in communication with at least a portion of the gate and the drain, a first portion of a gate oxide region in communication with at least a portion of the gate and the source, a second portion of a gate oxide region in communication with at least a portion of the gate and the drain. The source, the gate, the first capping layer, and the first portion of a gate oxide region define a first gap. The drain, the gate, the second capping layer, and the second portion of a gate oxide region define a second gap. The structure also includes a first junction area located beneath the first gap, the gate and the source and a second junction area located beneath the second gap, the gate and the drain.
申请公布号 US7115957(B2) 申请公布日期 2006.10.03
申请号 US20010008653 申请日期 2001.11.09
申请人 MICRON TECHNOLOGY, INC. 发明人 GONZALEZ FERNANDO;MOULI CHANDRA
分类号 H01L29/94;H01L21/285;H01L21/336;H01L21/768;H01L23/522;H01L29/417;H01L29/49 主分类号 H01L29/94
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