发明名称 Dielectric materials to prevent photoresist poisoning
摘要 Methods are provided for depositing a dielectric material for use as an anti-reflective coating and sacrificial dielectric material in damascene formation. In one aspect, a process is provided for processing a substrate including depositing an acidic dielectric layer on the substrate by reacting an oxygen-containing organosilicon compound and an acidic compound, depositing a photoresist material on the acidic dielectric layer, and patterning the photoresist layer. The acidic dielectric layer may be used as a sacrificial layer in forming a feature definition by etching a partial feature definition, depositing the acidic dielectric material, etching the remainder of the feature definition, and then removing the acidic dielectric material to form a feature definition.
申请公布号 US7115534(B2) 申请公布日期 2006.10.03
申请号 US20040847891 申请日期 2004.05.18
申请人 APPLIED MATERIALS, INC. 发明人 NGUYEN SON VAN;ARMACOST MICHAEL D.;NAIK MEHUL;DIXIT GIRISH A.;YIEH ELLIE Y.
分类号 H01L21/31;H01L21/469;H01L21/4763 主分类号 H01L21/31
代理机构 代理人
主权项
地址