发明名称 |
Thin film transistor, liquid crystal display device and method of fabricating the thin film transistor |
摘要 |
The present invention improves a productivity in growing an a-Si film in a thin film transistor and to obtain an excellent thin film transistor characteristic. More specifically, disclosed is a thin film transistor in which an amorphous silicon film 2 , a gate insulating film 3 and a gate electrode are sequentially stacked on an insulating substrate 1 . The amorphous silicon film 2 includes a low defect-density amorphous silicon layer 5 formed at a low deposition rate and a high deposition rate amorphous silicon layer 6 formed at a deposition rate higher than that of the low defect-density amorphous silicon layer 5 . The low defect-density amorphous silicon layer 5 in the amorphous silicon film 2 is grown closer to the insulating substrate 1 , and the high deposition rate amorphous silicon layer 6 is grown closer to the gate insulating film 3.
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申请公布号 |
US7115448(B2) |
申请公布日期 |
2006.10.03 |
申请号 |
US20040833754 |
申请日期 |
2004.04.28 |
申请人 |
AU OPTRONICS CORPORATION |
发明人 |
TSUJIMURA TAKATOSHI;TOKUHIRO OSAMU;MOROOKA MITSUO;MIYAMOTO TAKASHI |
分类号 |
H01L21/00;H01L21/205;G02F1/136;G02F1/1368;H01L21/336;H01L21/84;H01L29/786 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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