摘要 |
The invention relates to a probe ( 207 ) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member ( 200 ) for installation in a measuring assembly of a scanning probe microscope. The probe ( 207 ) is detachably mounted on the retaining member ( 200 ) by means of a clamping member ( 201 ), the clamping member being secured in self-locking fashion to the retaining member ( 200 ).
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