发明名称 Probe mounting device for a scanning probe microscope
摘要 The invention relates to a probe ( 207 ) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member ( 200 ) for installation in a measuring assembly of a scanning probe microscope. The probe ( 207 ) is detachably mounted on the retaining member ( 200 ) by means of a clamping member ( 201 ), the clamping member being secured in self-locking fashion to the retaining member ( 200 ).
申请公布号 US7114405(B2) 申请公布日期 2006.10.03
申请号 US20040490441 申请日期 2004.09.21
申请人 JPK INSTRUMENTS AG 发明人 SUENWOLDT OLAF;HASCHKE HEIKO
分类号 G01D21/00;G01Q30/14;G01Q70/02 主分类号 G01D21/00
代理机构 代理人
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