发明名称 Automatic statistical process control (SPC) chart generation apparatus and method thereof
摘要 A system and method for automatic SPC chart generation including a storage device and a data acquisition module. The storage device stores a chamber management tree, a recipe window management tree, a parameter configuration table and multiple chart profile records. The data acquisition module, which resides in a memory, acquires multiple process events and parameter values corresponding to the process events and a process parameter, selects a relevant statistical algorithm, calculates a statistical value by applying the statistical algorithm to the parameter values, creates a new chart profile record and a parameter statistics record therein if the chart profile record is absent, and stores the statistical values and measured time in the parameter statistics record.
申请公布号 US7117058(B2) 申请公布日期 2006.10.03
申请号 US20040875331 申请日期 2004.06.24
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN MU-TSANG;WANG TIEN-WEN;FANG JOSEPH W. L.;LAI IE-FUN;CHU CHON-HWA;CHEN JIAN-HONG;CHEN CHIN-CHIH;WU YU-YI;WU YAO-WEN;CHIEN WEN-SHENG
分类号 G06F19/00 主分类号 G06F19/00
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