发明名称 Lithographic apparatus and device manufacturing method
摘要 A system and method are used to form features on a substrate. The system and method include using a first array including individually controllable elements that selectively pattern a beam of radiation, a second array including sets of lenses and apertures stops that form an image from a respective one of the individually controllable elements in a first plane, a third array including lenses that form an image from a respective one of the second array in a second plane, and a substrate table that holds a substrate in the second plane, such that the substrate receives the image from the respective one of the second array. A same spacing is formed between elements in the first, second, and third arrays.
申请公布号 US7116402(B2) 申请公布日期 2006.10.03
申请号 US20040922106 申请日期 2004.08.20
申请人 ASML NETHERLANDS B.V 发明人 GUI CHENG-QUN
分类号 G03B27/54;G03F7/20;G02B3/00;G03B27/42;H01L21/027 主分类号 G03B27/54
代理机构 代理人
主权项
地址