发明名称 STRUCTURE AND PROCESS FOR REDUCING DIE CORNER AND EDGE STRESSES IN MICROELECTRONIC PACKAGES
摘要 A MICROELECTRONIC DIE IS ALIGNED WITH A PACKAGE SUBSTRATE AND ATTACHED TO IT USING SOLDER BALLS (350). A SPECIALLY SHAPED HEAT SPREADER, PREFERABLY WITH A COEFFICIENT OF THERMAL EXPANSION (CIE) SIMILAR TO THAT OF SILICON, IS ATTACHED TO THE BACK SIDE OF THE DIE USING A HEAT-CONDUCTING ADHESIVE. AN EPOXY-BASED MATERIAL IS FLOWED INTO THE GAP (360) BETWEEN THE DIE (330). THE SUBSTRATE (310), AND THE HEAT SPREADER VIA A THROUGH-HOLE IN EITHER THE SUBSTRATE OR THE HEAD SPREADER (300; 320) USING A DISPENSE PROCESS OR A TRANSFER MOLDING PROCESS. BY POSITIONING THE HEAT SPREADER TO ABOUT THE DIE CORNERS AND OR EDGES, THE STRESSES ON THE DIE ARE SUBSTANTIALLY REDUCED OR ELIMINATED. FIGS 3 & 7
申请公布号 MY126122(A) 申请公布日期 2006.09.29
申请号 MY2001PI04523 申请日期 2001.09.27
申请人 INTEL CORPORATION 发明人 MA, QING;MAVEETY, JIM;TRAN, QUAN
分类号 H01L23/34;H01L23/36;H01L23/367 主分类号 H01L23/34
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