| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and a device for characterizing a newly captured waveform, to distinguish waveform abnormalities on the basis of variations in the newly captured waveform, from one or more previously captured waveforms. SOLUTION: A history value representing a previously captured waveform relevant to a position is read out, with respect to each of a plurality of positions in a two-dimensional array relevant to the newly captured waveform (220); the count of a counter having a range of history values corresponding to the history value, out of a plurality of counters having individually different ranges of history values, is increased (230); the history value is changed and a new history value is generated (240); the new history value is written as a history value at the position (230); after all positions relevant to the newly captured waveform are processed, the variations in the newly captured waveform are determined with respect to the previously captured waveforms from the counts of the plurality of counters (250). COPYRIGHT: (C)2006,JPO&NCIPI
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