| 摘要 |
PROBLEM TO BE SOLVED: To provide a tester apparatus for an LSI carrying a complex input/output cell, which is configured to control a level applied to the LSI by using a test pattern and to indicate a driver selection or a receiver selection, in order to enable its test to be carried out without shutting off from a voltage supply when switching over a driver. SOLUTION: The tester apparatus which tests the LSI having a multilevel corresponding terminal in accordance with a test program, is equipped with; a driver selecting element which selects a driver meeting an input level of the multilevel corresponding terminal of the LSI, based on a test pattern transferred by the test program; and a receiver selecting element which selects a receiver meeting an output level of the multilevel corresponding terminal of the LSI, based on the test pattern transferred by the test program. COPYRIGHT: (C)2006,JPO&NCIPI
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