发明名称 |
SILICON-ON-NOTHING METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an SON (Silicon-On-Nothing) MOSFET and its manufacturing method which can improve demerits of bulk structure and SOI structure simultaneously by forming a blister within a silicon substrate. SOLUTION: The transistor comprises element isolation insulating films formed on upper both sides of the silicon substrate; a gate insulating film and a gate electrode formed on a silicon substrate surface between the element isolation insulating films in order; a source region and a drain region which are formed in a silicon substrate upper portion between the gate insulating film and the element isolation insulating film; the blister formed within the silicon substrate of a gate insulating film lower portion; and a silicon channel within the silicon substrate which is surrounded by the blister, and the source and drain regions. The blister is formed of hydrogen or helium ions. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006261662(A) |
申请公布日期 |
2006.09.28 |
申请号 |
JP20060059716 |
申请日期 |
2006.03.06 |
申请人 |
KOREA ADVANCED INST OF SCI TECHNOL |
发明人 |
CHOI YANG-KYU;JANG DONG-YOON |
分类号 |
H01L29/786;H01L21/02;H01L21/265;H01L21/76;H01L21/764;H01L27/12 |
主分类号 |
H01L29/786 |
代理机构 |
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主权项 |
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地址 |
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