发明名称 SILICON-ON-NOTHING METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an SON (Silicon-On-Nothing) MOSFET and its manufacturing method which can improve demerits of bulk structure and SOI structure simultaneously by forming a blister within a silicon substrate. SOLUTION: The transistor comprises element isolation insulating films formed on upper both sides of the silicon substrate; a gate insulating film and a gate electrode formed on a silicon substrate surface between the element isolation insulating films in order; a source region and a drain region which are formed in a silicon substrate upper portion between the gate insulating film and the element isolation insulating film; the blister formed within the silicon substrate of a gate insulating film lower portion; and a silicon channel within the silicon substrate which is surrounded by the blister, and the source and drain regions. The blister is formed of hydrogen or helium ions. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006261662(A) 申请公布日期 2006.09.28
申请号 JP20060059716 申请日期 2006.03.06
申请人 KOREA ADVANCED INST OF SCI TECHNOL 发明人 CHOI YANG-KYU;JANG DONG-YOON
分类号 H01L29/786;H01L21/02;H01L21/265;H01L21/76;H01L21/764;H01L27/12 主分类号 H01L29/786
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