发明名称 METHOD OF MANUFACTURING INSULATED GATE TYPE SEMICONDUCTOR APPARATUS
摘要 PROBLEM TO BE SOLVED: To constitute gate electrodes of a single crystal semiconductor of high crystallinity by a simple manufacturing process concerning a method of manufacturing an insulated gate type semiconductor apparatus. SOLUTION: After ion-injecting an element 5 for exfoliation to the single crystal semiconductor substrate 4 for pasting, the single crystal semiconductor substrate 4 for pasting is pasted to a single crystal semiconductor substrate 1 for forming an element having an insulating film 3 formed thereon, so that the ion-injecting side of the single crystal semiconductor substrate 4 for pasting may be a pasting surface. Next, thermal treatment is carried out and the single crystal semiconductor substrate 4 for pasting is exfoliated in the vicinity of the concentration peak position of the injected element. Thereafter, the remaining part 6 of the single crystal semiconductor substrate 4 for pasting remaining on the side of the single crystal semiconductor substrate 1 for forming an element is etched in the state of the gate electrodes. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006261591(A) 申请公布日期 2006.09.28
申请号 JP20050080300 申请日期 2005.03.18
申请人 FUJITSU LTD 发明人 NAKANISHI TOSHIRO
分类号 H01L21/8247;H01L21/02;H01L21/265;H01L21/28;H01L21/285;H01L27/115;H01L27/12;H01L29/423;H01L29/49;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/8247
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