| 摘要 |
PROBLEM TO BE SOLVED: To provide a failure detection improving device, a failure detection improving program, and a failure detection improving method improving a failure detection rate by carrying out change of a circuit such that an ATPG tool can generate a test pattern. SOLUTION: The failure detection improving device is for correcting a netlist, and it is provided with a netlist input part for inputting the netlist, a circuit correcting part adding an FF for observation in a suitable place in the netlist, and a netlist output part outputting the netlist changed by the circuit correcting part. COPYRIGHT: (C)2006,JPO&NCIPI
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