发明名称 METHOD FOR FORMING BURIED DOPED REGION
摘要 A method for forming a buried doped region is provided. A first insulating layer is formed on a substrate and the first insulating layer is patterned to from an opening that extends in a first direction. A buried doped region is formed in the substrate exposed by the opening. Thereafter, a second insulating layer is formed on the substrate to fill the opening. The second insulating layer together with the first insulation layer form a third insulating layer. The third insulating layer is patterned to form an isolation layer that exposes the substrate and the buried doped region. The isolation layer extends in a second direction and crosses over the first direction. A semiconductor layer is formed on the substrate to fill the areas on the respective sides of the isolation layer.
申请公布号 US2006216915(A1) 申请公布日期 2006.09.28
申请号 US20050163728 申请日期 2005.10.28
申请人 HUANG CHIU-TSUNG;CHANG SU-YUAN 发明人 HUANG CHIU-TSUNG;CHANG SU-YUAN
分类号 H01L21/425 主分类号 H01L21/425
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