发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device wherein a copper oxide is sufficiently removed from copper wiring and an insulating film for preventing the diffusion of a water content and Cu can be made of a low-dielectric-constant insulating material, and to provide its manufacturing method. SOLUTION: The manufacturing method includes a step where copper wiring wherein a copper oxide film is formed on its surface is coated with a composition for forming an insulating film that contains a silicon compound having a diffusion barrier property against copper and an organic compound for reducing a copper oxide, and a step where the copper oxide film is reduced by the organic compound and removed by heat treatment and the silicon compound is cured to form an insulating film made of a silicon compound. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006261268(A) 申请公布日期 2006.09.28
申请号 JP20050074445 申请日期 2005.03.16
申请人 FUJITSU LTD 发明人 OZAKI SHIRO;NAKADA YOSHIHIRO
分类号 H01L21/3205;H01L21/28;H01L21/316;H01L21/768;H01L23/52;H01L23/522;H01L29/417 主分类号 H01L21/3205
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